44 search results - page 3 / 9 » On the role of timing masking in reliable logic circuit desi... |
VTS
2000
IEEE
13 years 10 months ago
2000
IEEE
Redundancy techniques are commonly used to design dependable systems to ensure high reliability, availability and data integrity. Triple Modular Redundancy (TMR) is a widely used ...
ISQED
2009
IEEE
14 years 9 days ago
2009
IEEE
Abstract — Nanoelectronic design faces unprecedented reliability challenges and must achieve noise immunity and delay insensitiveness in the presence of prevalent defects and sig...
CSREAESA
2006
13 years 7 months ago
2006
- Triple Modular Redundancy is widely used in dependable systems design to ensure high reliability against soft errors. Conventional TMR is effective in protecting sequential circu...
DAC
2005
ACM
13 years 7 months ago
2005
ACM
This paper presents a new test response compaction technique with any number of unknown logic values (X’s) in the test response bits. The technique leverages an X-tolerant respo...
DAC
2007
ACM
14 years 6 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...