3 search results - page 1 / 1 » On-Chip Spectrum Analyzer for Analog Built-In Self Test |
VTS
2005
IEEE
13 years 11 months ago
2005
IEEE
This paper presents the design of an on-chip spectrum analyzer. A novel architecture is used to mitigate the problems encountered in trying to implement architectures employed in ...
ISCAS
2007
IEEE
13 years 11 months ago
2007
IEEE
—A Built-In Self-Test (BIST) approach for functionality measurements, including noise figure (NF), linearity and frequency response of analog circuitry in mixedsignal systems, is...
VTS
2002
IEEE
13 years 10 months ago
2002
IEEE
Single-bit second-order delta-sigma modulators are commonly used in high-resolution ADCs. Testing this type of modulator requires a high-resolution test stimulus, which is diffic...