Abstract—We introduce a technique for on-line built-in selftesting (BIST) of bus-based field programmable gate arrays (FPGA’s). This system detects deviations from the intende...
N. R. Shnidman, William H. Mangione-Smith, Miodrag...
ABSTRACT: We present a Built-In Self-Test (BIST) approach for programmable embedded memories in Xilinx Virtex-4 Field Programmable Gate Arrays (FPGAs). The target resources are the...
Brooks R. Garrison, Daniel T. Milton, Charles E. S...
Adaptive fault isolation methods based on discrepancyenabled pairwise comparisons are developed for reconfigurable logic devices. By observing the discrepancy characteristics of m...
Two embedded processor based fault injection case studies are presented which are applicable to Field Programmable Gate Arrays (FPGAs) and FPGA cores in configurable System-on-Chip...
Bradley F. Dutton, Mustafa Ali, Charles E. Stroud,...
The partial reconfiguration feature of some of the currentgeneration Field Programmable Gate Arrays (FPGAs) can improve dependability by detecting and correcting errors in onchip ...