61 search results - page 1 / 13 » Optimization objectives and models of variation for statisti... |
GLVLSI
2005
IEEE
13 years 10 months ago
2005
IEEE
This paper approaches statistical optimization by examining gate delay variation models and optimization objectives. Most previous work on statistical optimization has focused exc...
TVLSI
2008
13 years 4 months ago
2008
Abstract--Technology scaling in the nanometer era has increased the transistor's susceptibility to process variations. The effects of such variations are having a huge impact ...
ICCAD
2005
IEEE
14 years 1 months ago
2005
IEEE
— As technology scales into the sub-90nm domain, manufacturing variations become an increasingly significant portion of circuit delay. As a result, delays must be modeled as sta...
DATE
2000
IEEE
13 years 9 months ago
2000
IEEE
This paper is about gate sizing under a statistical delay model. It shows we can solve the gate sizing problem exactly for a given statistical delay model. The formulation used al...
PATMOS
2007
Springer
13 years 10 months ago
2007
Springer
—Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the...