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» Parametric Fault Simulation and Test Vector Generation
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DATE
2006
IEEE
98views Hardware» more  DATE 2006»
13 years 11 months ago
Test generation for combinational quantum cellular automata (QCA) circuits
— In this paper, we present a test generation framework for testing of quantum cellular automata (QCA) circuits. QCA is a nanotechnology that has attracted significant recent at...
Pallav Gupta, Niraj K. Jha, Loganathan Lingappan
DSD
2005
IEEE
105views Hardware» more  DSD 2005»
13 years 11 months ago
Improved Fault Emulation for Synchronous Sequential Circuits
Current paper presents new alternatives for accelerating the task of fault simulation for sequential circuits by hardware emulation on FPGA. Fault simulation is an important subta...
Jaan Raik, Peeter Ellervee, Valentin Tihhomirov, R...
ICCAD
2006
IEEE
134views Hardware» more  ICCAD 2006»
14 years 2 months ago
A delay fault model for at-speed fault simulation and test generation
We describe a transition fault model, which is easy to simulate under test sequences that are applied at-speed, and provides a target for the generation of at-speed test sequences...
Irith Pomeranz, Sudhakar M. Reddy
ITC
1999
IEEE
103views Hardware» more  ITC 1999»
13 years 9 months ago
Resistive bridge fault modeling, simulation and test generation
Resistive bridging faults in combinational CMOS circuits are studied in this work. Circuit-level models are ed to voltage behavior for use in voltage-level fault simulation and te...
Vijay R. Sar-Dessai, D. M. H. Walker
FPL
2004
Springer
94views Hardware» more  FPL 2004»
13 years 10 months ago
Evaluating Fault Emulation on FPGA
Abstract. We present an evaluation of accelerating fault simulation by hardware emulation on FPGA. Fault simulation is an important subtask in test pattern generation and it is fre...
Peeter Ellervee, Jaan Raik, Valentin Tihhomirov, K...