35 search results - page 2 / 7 » Parametric yield estimation considering leakage variability |
CODES
2006
IEEE
13 years 11 months ago
2006
IEEE
Process variability has a detrimental impact on the performance of memories and other system components, which can lead to parametric yield loss at the system level due to timing ...
ICCAD
2006
IEEE
14 years 1 months ago
2006
IEEE
Reliable prediction of parametric yield for a specific design is difficult; a significant reason is the reliance of the yield estimation methods on the hard-to-measure distributio...
ICCAD
2006
IEEE
14 years 1 months ago
2006
IEEE
Parametric yield loss due to variability can be effectively reduced by both design-time optimization strategies and by adjusting circuit parameters to the realizations of variable...
DAC
2005
ACM
14 years 6 months ago
2005
ACM
Power minimization under variability is formulated as a rigorous statistical robust optimization program with a guarantee of power and timing yields. Both power and timing metrics...
ICCAD
1998
IEEE
13 years 9 months ago
1998
IEEE
This paper presents an efficient statistical design methodology that allows simultaneous sizing for performance and optimization for yield and robustness of analog circuits. The s...