16 search results - page 2 / 4 » Perturbation-based Fault Screening |
DAC
2006
ACM
14 years 5 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
DFT
1999
IEEE
13 years 9 months ago
1999
IEEE
In this paper, we present a memory fault simulator called the Random Access Memory Simulator for Error Screening (RAMSES). Although it was designed based on some wellknown memory ...
AINA
2006
IEEE
13 years 10 months ago
2006
IEEE
Grids have the potential to revolutionize computing by providing ubiquitous, on demand access to computational services and resources. However, grid systems are extremely large, c...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
In the last decade, the focus of fault-tolerance methods has tended towards circuit level modifications, such as transistor resizing, and away from expensive system level redunda...
ITC
2002
IEEE
13 years 9 months ago
2002
IEEE
With increasing chip interconnect distances, openinterconnect is becoming an important defect. The main challenge with open-interconnects stems from its non-deterministic real-lif...