41 search results - page 1 / 9 » Power Supply Noise Analysis Methodology for Deep-Submicron V... |
DAC
1997
ACM
13 years 9 months ago
1997
ACM
This paper describes a new design methodology to analyze the on-chip power supply noise for high performance microprocessors. Based on an integrated package-level and chip-level p...
DAC
1999
ACM
14 years 5 months ago
1999
ACM
ISCAS
1995
IEEE
13 years 8 months ago
1995
IEEE
— This paper introduces a simple analytical model for estimating standby and switching power dissipation in deep submicron CMOS digital circuits. The model is based on Berkeley S...
GLVLSI
2003
IEEE
13 years 10 months ago
2003
IEEE
With scaling down to deep submicron and nanometer technologies, noise immunity is becoming a metric of the same importance as power, speed, and area. Smaller feature sizes, low vo...
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
A device testing method called Transient Signal Analysis (TSA) is subjected to elements of a real process and testing environment in this paper. Simulations experiments are design...