33 search results - page 6 / 7 » Power calculation and modeling in deep submicron |
DAC
2009
ACM
14 years 6 months ago
2009
ACM
Embedded cryptosystems show increased vulnerabilities to implementation attacks such as power analysis. CMOS technology trends are causing increased process variations which impac...
ICCAD
2003
IEEE
14 years 2 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
GLVLSI
2003
IEEE
13 years 10 months ago
2003
IEEE
The use of multiple supply voltages for energy and average power reduction is well researched and several works have appeared in the literature. However, in low power design using...
ICCAD
2010
IEEE
13 years 3 months ago
2010
IEEE
Reducing circuit's peak current plays an important role in circuit reliability in deep sub-micron era. For sequential circuits, it is observed that the peak current has a str...
ICCD
2005
IEEE
14 years 2 months ago
2005
IEEE
As technology scales, interconnects dominate the performance and power behavior of deep submicron designs. Three-dimensional integrated circuits (3D ICs) have been proposed as a w...