52 search results - page 2 / 11 » Power-Aware Testing and Test Strategies for Low Power Device... |
ISQED
2000
IEEE
13 years 9 months ago
2000
IEEE
Power and energy consumption of digital systems may increase significantly during testing. This extra power consumption due to test application may give rise to severe hazards to ...
ATS
2005
IEEE
13 years 11 months ago
2005
IEEE
—Test application at reduced power supply voltage (low-voltage testing) or reduced temperature (low-temperature testing) can improve the defect coverage of a test set, particular...
DAC
2005
ACM
14 years 6 months ago
2005
ACM
We propose a system architecture for real-time hardware speech recognition on low-cost, power-constrained devices. The system is intended to support real-time speech-based user in...
ATS
1998
IEEE
13 years 9 months ago
1998
IEEE
A current sensing device, namely Hall Effect MOSFET (HEMOS) is proposed. It is experimentally shown that the HEMOS enables a non-contacting, and non-disturbing current measurement...
ICCD
2004
IEEE
14 years 2 months ago
2004
IEEE
— Reduction in test power is important to improve battery life in portable devices employing periodic self-test, to increase reliability of testing and to reduce test-cost. In sc...