129 search results - page 2 / 26 » Process Variations and their Impact on Circuit Operation |
DAC
2003
ACM
14 years 6 months ago
2003
ACM
Parameter variation in scaled technologies beyond 90nm will pose a major challenge for design of future high performance microprocessors. In this paper, we discuss process, voltag...
DAC
2009
ACM
14 years 6 months ago
2009
ACM
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
DAC
2009
ACM
14 years 6 months ago
2009
ACM
Embedded cryptosystems show increased vulnerabilities to implementation attacks such as power analysis. CMOS technology trends are causing increased process variations which impac...
DATE
2009
IEEE
2009
IEEE
Analyzing the impact of process variations on parametric measurements: Novel models and applications
14 years 9 hour ago
Abstract—In this paper we propose a novel statistical framework to model the impact of process variations on semiconductor circuits through the use of process sensitive test stru...
ICCAD
2007
IEEE
14 years 2 months ago
2007
IEEE
— As CMOS technology enters the nanometer regime, the increasing process variation is bringing manifest impact on circuit performance. In this paper, we propose a Principle Hessi...