46 search results - page 2 / 10 » Process variation aware cache leakage management |
MICRO
2009
IEEE
14 years 7 days ago
2009
IEEE
Process variations in integrated circuits have significant impact on their performance, leakage and stability. This is particularly evident in large, regular and dense structures...
ISLPED
2005
ACM
13 years 11 months ago
2005
ACM
Leakage power is one of the most critical issues for ultra-deep submicron technology. Subthreshold leakage depends exponentially on linewidth, and consequently variation in linewi...
DAC
2004
ACM
14 years 6 months ago
2004
ACM
timing analysis tools to replace standard deterministic static timing analyzers whereas [8,27] develop approaches for the statistical estimation of leakage power considering within...
TVLSI
2008
13 years 5 months ago
2008
As CMOS technology scales deeper into the nanometer regime, factors such as leakage power and chip temperature emerge as critically important concerns for high-performance VLSI des...
VLSID
2008
IEEE
14 years 6 months ago
2008
IEEE
Continuous technology scaling has resulted in an increase in both, the power density as well as the variation in device dimensions (process variations) of the manufactured process...