17 search results - page 1 / 4 » Proptest: A Property Based Test Pattern Generator for Sequen... |
DAC
1999
ACM
14 years 5 months ago
1999
ACM
ET
2000
13 years 4 months ago
2000
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
ICCAD
1998
IEEE
13 years 9 months ago
1998
IEEE
In this paper, we present results for significantly improving the performance of sequential circuit diagnostic test pattern generation (DATPG). Our improvements are achieved by de...
EURODAC
1995
IEEE
13 years 8 months ago
1995
IEEE
: We present a new, dynamic algorithm for test sequence compaction and test cycle reduction for combinationaland sequential circuits. Several dynamic algorithms for compaction in c...
DATE
1999
IEEE
13 years 9 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...