11 search results - page 1 / 3 » Random Access Scan: A solution to test power, test data volu... |
VLSID
2004
IEEE
14 years 5 months ago
2004
IEEE
DFT
2002
IEEE
13 years 9 months ago
2002
IEEE
Conversion of the flip-flops of the circuit into scan cells helps ease the test challenge; yet test application time is increased as serial shift operations are employed. Furthe...
VTS
2005
IEEE
13 years 10 months ago
2005
IEEE
This paper presents a test architecture that addresses multiple problems faced in digital IC testing. These problems are test data volume, test application time, test power consum...
ISQED
2010
IEEE
13 years 10 months ago
2010
IEEE
— This paper proposes a two-dimensional scan shift control concept for multiple scan chain design. Multiple scan chain test scheme provides very low scan power by skipping many l...
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
In this paper, we propose a new method for test access and test scheduling in NoC-based system. It relies on a progressive reuse of the network resources for transporting test dat...