33 search results - page 2 / 7 » Reconfiguration and Fine-Grained Redundancy for Fault Tolera... |
ETFA
2006
IEEE
13 years 10 months ago
2006
IEEE
♦ To increase the amount of logic available to the users in SRAM-based FPGAs, manufacturers are using nanometric technologies to boost logic density and reduce costs, making its ...
FPL
2006
Springer
13 years 8 months ago
2006
Springer
Reconfigurable architectures are becoming increasingly popular with space related design engineers as they are inherently flexible to meet multiple requirements and offer signific...
IOLTS
2007
IEEE
13 years 11 months ago
2007
IEEE
i To boost logic density and reduce per unit power consumption SRAM-based FPGAs manufacturers adopted nanometric technologies. However, this technology is highly vulnerable to radi...
FPGA
2000
ACM
13 years 8 months ago
2000
ACM
In recent years the application space of reconfigurable devices has grown to include many platforms with a strong need for fault tolerance. While these systems frequently contain ...
ICCAD
2008
IEEE
14 years 1 months ago
2008
IEEE
—When manufacturing nano-devices, defects are a certainty and reliability becomes a critical issue. Until now, the most pervasive methods used to address reliability, involve inj...