18 search results - page 3 / 4 » Reducing resource redundancy for concurrent error detection ... |
ISCA
2005
IEEE
13 years 11 months ago
2005
IEEE
CMOS scaling increases susceptibility of microprocessors to transient faults. Most current proposals for transient-fault detection use full redundancy to achieve perfect coverage ...
TDSC
2010
13 years 3 months ago
2010
—Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of internal noise and external sources such as cosmic particle hits. Though soft ...
ISCA
2009
IEEE
14 years 11 hour ago
2009
IEEE
This paper presents a novel technique, Memory Mapped ECC, which reduces the cost of providing error correction for SRAM caches. It is important to limit such overheads as processo...
ISCA
2007
IEEE
13 years 11 months ago
2007
IEEE
Transient faults due to particle strikes are a key challenge in microprocessor design. Driven by exponentially increasing transistor counts, per-chip faults are a growing burden. ...
IPPS
2006
IEEE
13 years 11 months ago
2006
IEEE
The performance requirements for contemporary microprocessors are increasing as rapidly as their number of applications grows. By accelerating the clock, performance can be gained...