20 search results - page 2 / 4 » Reducing test data volume using external LBIST hybrid test p... |
BNCOD
2003
13 years 6 months ago
2003
Evaluating a query can involve manipulation of large volumes of temporary data. When the volume of data becomes too great, activities such as joins and sorting must use disk, and ...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
We present Low Power Illinois scan architecture (LPILS) to achieve power dissipation and test data volume reduction, simultaneously. By using the proposed scan architecture, dynam...
DFT
2006
IEEE
13 years 11 months ago
2006
IEEE
This paper describes a methodology of creating a built-in diagnostic system of a System on Chip and experimental results of the system application on the AT94K FPSLIC with cores d...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
We present a hybrid BIST approach that extracts the most frequently occurring sequences from deterministic test patterns; these extracted sequences are stored on-chip. We use clus...
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
—We present a dictionary-based test data compression approach for reducing test data volume and testing time in SOCs. The proposed method is based on the use of a small number of...