11 search results - page 1 / 3 » SEU-Tolerant QDI Circuits |
ISQED
2006
IEEE
13 years 10 months ago
2006
IEEE
Due to aggressive technology scaling, VLSI circuits are becoming increasingly susceptible to transient errors caused by single-event-upsets (SEUs). In this paper, we introduce two...
DAC
2005
ACM
13 years 6 months ago
2005
ACM
ASYNC
2005
IEEE
13 years 10 months ago
2005
IEEE
This paper addresses the issue of Single-Event Upset (SEU) in quasi delay-insensitive (QDI) asynchronous circuits. We show that an SEU can cause abnormal computations in QDI circu...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
The purpose of this paper is to formally specify a flow devoted to the design of Differential Power Analysis (DPA) resistant QDI asynchronous circuits. The paper first proposes a ...
VLSI
2005
Springer
13 years 10 months ago
2005
Springer
Quasi delay insensitive circuits are functionally independent of delays in gates and wires (except for some particular wires). Such asynchronous circuits offer high robustness but...