6 search results - page 1 / 2 » SNR measurement based on linearity test for ADC BIST |
ISCAS
2011
IEEE
12 years 8 months ago
2011
IEEE
—Linearity and spectral performance test contributes most cost of ADC test. This paper presents a new method for testing an ADC’s SNR from its linearity test data. The method d...
DATE
2000
IEEE
13 years 9 months ago
2000
IEEE
In this paper, we present a BIST scheme for testing onchip AD and DA converters. We discuss on-chip generation of linear ramps as test stimuli, and propose techniques for measurin...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
This paper presents a built-in self-test (BiST) scheme for analog to digital converters (ADC) based on a linear ramp generator and efficient output analysis. The proposed analysi...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
As the performance of Analog-to-Digital Converters continues to improve, it is becoming more challenging and costly to develop sufficiently fast and low-drift signal generators th...
ISCAS
2007
IEEE
13 years 11 months ago
2007
IEEE
—A Built-In Self-Test (BIST) approach for functionality measurements, including noise figure (NF), linearity and frequency response of analog circuitry in mixedsignal systems, is...