102 search results - page 1 / 21 » Scalable techniques and tools for reliability analysis of la... |
VLSID
2007
IEEE
14 years 5 months ago
2007
IEEE
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
Reliability of logic circuits is emerging as an important concern that may limit the benefits of continued scaling of process technology and the emergence of future technology al...
ICCAD
2003
IEEE
14 years 1 months ago
2003
IEEE
Placement is one of the most important steps in the RTLto-GDSII synthesis process, as it directly defines the interconnects, which have become the bottleneck in circuit and syste...
DAC
2004
ACM
14 years 5 months ago
2004
ACM
Circuits using nano-meter technologies are becoming increasingly vulnerable to signal interference from multiple noise sources as well as radiation-induced soft errors. One way to...
GLVLSI
2005
IEEE
13 years 10 months ago
2005
IEEE
A hierarchical scheme with cells and modules is crucial for managing design complexity during a large integrated circuit design. We present a methodology for thermal aware cell-ba...