3 search results - page 1 / 1 » Skew management of NBTI impacted gated clock trees |
ISPD
2010
ACM
13 years 12 months ago
2010
ACM
NBTI (Negative Bias Temperature Instability) has emerged as the dominant failure mechanism for PMOS in nanometer IC designs. However, its impact on one of the most important compo...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
NBTI (Negative Bias Temperature Instability) has emerged as the dominant PMOS device failure mechanism for sub100nm VLSI designs. There is little research to quantify its impact o...
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
The existence of non-uniform thermal gradients on the substrate in high performance IC’s can significantly impact the performance of global on-chip interconnects. This issue is...