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» Static Pin Mapping and SOC Test Scheduling for Cores with Mu...
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ISQED
2003
IEEE
85views Hardware» more  ISQED 2003»
10 years 1 months ago
Static Pin Mapping and SOC Test Scheduling for Cores with Multiple Test Sets
An algorithm for mapping core terminals to System-On-a-Chip (SOC) I/O pins and scheduling tests in order to achieve costefficient concurrent test for core-based designs is present...
Yu Huang, Wu-Tung Cheng, Chien-Chung Tsai, Nilanja...
VLSID
2002
IEEE
98views VLSI» more  VLSID 2002»
10 years 8 months ago
On Test Scheduling for Core-Based SOCs
We present a mathematical model for the problem of scheduling tests for core-based system-on-chip (SOC) VLSI designs. Given a set of tests for each core in the SOC and a set of te...
Sandeep Koranne
GLVLSI
2002
IEEE
98views VLSI» more  GLVLSI 2002»
10 years 24 days ago
Minimizing concurrent test time in SoC's by balancing resource usage
We present a novel test scheduling algorithm for embedded corebased SoC’s. Given a system integrated with a set of cores and a set of test resources, we select a test for each c...
Dan Zhao, Shambhu J. Upadhyaya, Martin Margala
CODES
2010
IEEE
9 years 4 months ago
Hardware/software optimization of error detection implementation for real-time embedded systems
This paper presents an approach to system-level optimization of error detection implementation in the context of fault-tolerant realtime distributed embedded systems used for safe...
Adrian Lifa, Petru Eles, Zebo Peng, Viacheslav Izo...
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