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» Static Pin Mapping and SOC Test Scheduling for Cores with Mu...
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ISQED
2003
IEEE
85views Hardware» more  ISQED 2003»
13 years 10 months ago
Static Pin Mapping and SOC Test Scheduling for Cores with Multiple Test Sets
An algorithm for mapping core terminals to System-On-a-Chip (SOC) I/O pins and scheduling tests in order to achieve costefficient concurrent test for core-based designs is present...
Yu Huang, Wu-Tung Cheng, Chien-Chung Tsai, Nilanja...
VLSID
2002
IEEE
98views VLSI» more  VLSID 2002»
14 years 5 months ago
On Test Scheduling for Core-Based SOCs
We present a mathematical model for the problem of scheduling tests for core-based system-on-chip (SOC) VLSI designs. Given a set of tests for each core in the SOC and a set of te...
Sandeep Koranne
GLVLSI
2002
IEEE
98views VLSI» more  GLVLSI 2002»
13 years 10 months ago
Minimizing concurrent test time in SoC's by balancing resource usage
We present a novel test scheduling algorithm for embedded corebased SoC’s. Given a system integrated with a set of cores and a set of test resources, we select a test for each c...
Dan Zhao, Shambhu J. Upadhyaya, Martin Margala
CODES
2010
IEEE
13 years 1 months ago
Hardware/software optimization of error detection implementation for real-time embedded systems
This paper presents an approach to system-level optimization of error detection implementation in the context of fault-tolerant realtime distributed embedded systems used for safe...
Adrian Lifa, Petru Eles, Zebo Peng, Viacheslav Izo...