8 search results - page 1 / 2 » Statistical Analysis of Full-Chip Leakage Power Considering ... |
DAC
2007
ACM
14 years 6 months ago
2007
ACM
In this paper we address the the growing issue of junction tunneling leakage (Ijunc) at the circuit level. Specifically, we develop a fast approach to analyze the state-dependent ...
DAC
2005
ACM
14 years 6 months ago
2005
ACM
In this paper, we present a method for analyzing the leakage current, and hence the leakage power, of a circuit under process parameter variations that can include spatial correla...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
In nanometer scaled CMOS devices significant increase in the subthreshold, the gate and the reverse biased junction band-toband-tunneling (BTBT) leakage, results in the large incr...
DAC
2004
ACM
13 years 9 months ago
2004
ACM
The high leakage current in nano-meter regimes is becoming a significant portion of power dissipation in CMOS circuits as threshold voltage, channel length, and gate oxide thickne...
TCAD
2008
13 years 5 months ago
2008
The nonuniform substrate thermal profile and process variations are two major concerns in the present-day ultradeep submicrometer designs. To correctly predict performance/ leakage...