1459 search results - page 2 / 292 » Statistical Modeling for Circuit Simulation |
ISQED
2007
IEEE
13 years 11 months ago
2007
IEEE
We propose gate level statistical simulation to bridge the gap between the most accurate Monte Carlo SPICE simulation and the most efficient circuit level statistical static timi...
DATE
2000
IEEE
13 years 9 months ago
2000
IEEE
Process variation has forever been the major fail cause of analog circuit where small deviations in component values cause large deviations in the measured output parameters. This...
ICCAD
1993
IEEE
13 years 9 months ago
1993
IEEE
An analytical-knowledge-based statistical method is developed to derive macromodels for the highly nonlinear A.C. response functions of CMOS Op-amp circuits. Simple circuit analys...
EURODAC
1994
IEEE
13 years 9 months ago
1994
IEEE
- The accelerator is destined to circuit-level simulation of digital and analog/digital MOS VLSI'c containing of up to 100 thousand transistors (with 16 Mb RAM host-machine). ...
PATMOS
2007
Springer
13 years 11 months ago
2007
Springer
Abstract. The continuous miniaturization of semiconductor devices imposes serious threats to design robustness against process variations and environmental fluctuations. Modern ci...