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» Synthesis of Efficient Linear Test Pattern Generators
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DFT
2006
IEEE
125views VLSI» more  DFT 2006»
9 years 8 months ago
Synthesis of Efficient Linear Test Pattern Generators
This paper presents a procedure for Synthesis of LINear test pattern Generators called SLING. SLING can synthesize linear test pattern generators that satisfy constraints on area,...
Avijit Dutta, Nur A. Touba
ICCAD
1995
IEEE
120views Hardware» more  ICCAD 1995»
9 years 6 months ago
Pattern generation for a deterministic BIST scheme
Recently a deterministic built-in self-test scheme has been presented based on reseeding of multiple-polynomial linear feedback shift registers. This scheme encodes deterministic ...
Sybille Hellebrand, Birgit Reeb, Steffen Tarnick, ...
VTS
1995
IEEE
94views Hardware» more  VTS 1995»
9 years 5 months ago
Synthesis of locally exhaustive test pattern generators
Optimized locally exhaustive test pattern generators based on linear sums promise a low overhead, but have an irregular structure. The paper presents a new algorithm able to compu...
Günter Kemnitz
ATS
1998
IEEE
170views Hardware» more  ATS 1998»
9 years 6 months ago
A Ring Architecture Strategy for BIST Test Pattern Generation
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
Christophe Fagot, Olivier Gascuel, Patrick Girard,...
DATE
1997
IEEE
100views Hardware» more  DATE 1997»
9 years 6 months ago
On the generation of pseudo-deterministic two-patterns test sequence with LFSRs
Many Built-In Self Test pattern generators use Linear Feedback Shift Registers (LFSR) to generate test sequences. In this paper, we address the generation of deterministic pairs o...
Christian Dufaza, Yervant Zorian
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