171 search results - page 1 / 35 » Synthesis of Efficient Linear Test Pattern Generators |
DFT
2006
IEEE
13 years 10 months ago
2006
IEEE
This paper presents a procedure for Synthesis of LINear test pattern Generators called SLING. SLING can synthesize linear test pattern generators that satisfy constraints on area,...
ICCAD
1995
IEEE
13 years 8 months ago
1995
IEEE
Recently a deterministic built-in self-test scheme has been presented based on reseeding of multiple-polynomial linear feedback shift registers. This scheme encodes deterministic ...
VTS
1995
IEEE
13 years 8 months ago
1995
IEEE
Optimized locally exhaustive test pattern generators based on linear sums promise a low overhead, but have an irregular structure. The paper presents a new algorithm able to compu...
ATS
1998
IEEE
13 years 8 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
DATE
1997
IEEE
13 years 8 months ago
1997
IEEE
Many Built-In Self Test pattern generators use Linear Feedback Shift Registers (LFSR) to generate test sequences. In this paper, we address the generation of deterministic pairs o...