64 search results - page 2 / 13 » Synthesis of locally exhaustive test pattern generators |
ITC
1998
IEEE
13 years 9 months ago
1998
IEEE
This paper presents a logic synthesis tool called BETSY (BIST Environment Testable Synthesis) for synthesizing circuits that achieve complete (100%)fault coverage in a user specif...
ICCAD
1995
IEEE
13 years 8 months ago
1995
IEEE
Recently a deterministic built-in self-test scheme has been presented based on reseeding of multiple-polynomial linear feedback shift registers. This scheme encodes deterministic ...
DATE
1997
IEEE
13 years 9 months ago
1997
IEEE
Many Built-In Self Test pattern generators use Linear Feedback Shift Registers (LFSR) to generate test sequences. In this paper, we address the generation of deterministic pairs o...
EURODAC
1995
IEEE
13 years 8 months ago
1995
IEEE
This paper describes the features and design methodology of MIDA, a MPEG1 integrated audio decoder. MIDA has been almost completely designed using automatic synthesis of VHDL desc...
ATS
1998
IEEE
13 years 9 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...