176 search results - page 3 / 36 » Techniques for Functional Test Pattern Execution |
DAC
1994
ACM
13 years 9 months ago
1994
ACM
Recent results indicate that functional test pattern generation (TPG) techniques may provide better defect coverages than do traditional logic-level techniques. Functional TPG alg...
VTS
2000
IEEE
13 years 9 months ago
2000
IEEE
1 At-speed testing is becoming increasingly difficult with external testers as the speed of microprocessors approaches the GHz range. One solution to this problem is built-in self-...
IJCSA
2007
13 years 5 months ago
2007
This article presents experiences in the automation of a testing process. The main goal is the unified testing of not only one program, but a whole family of programs. The family ...
ICSE
2008
IEEE-ACM
14 years 6 months ago
2008
IEEE-ACM
Dynamically discovering likely program invariants from concrete test executions has emerged as a highly promising software engineering technique. Dynamic invariant inference has t...
DAC
1999
ACM
13 years 9 months ago
1999
ACM
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests which can be run at native speeds is becoming a serious proble...