55 search results - page 2 / 11 » Test Strategies for Low Power Devices |
ATS
2005
IEEE
13 years 10 months ago
2005
IEEE
—Test application at reduced power supply voltage (low-voltage testing) or reduced temperature (low-temperature testing) can improve the defect coverage of a test set, particular...
ICCD
2004
IEEE
14 years 1 months ago
2004
IEEE
— Reduction in test power is important to improve battery life in portable devices employing periodic self-test, to increase reliability of testing and to reduce test-cost. In sc...
ATS
1998
IEEE
13 years 9 months ago
1998
IEEE
A current sensing device, namely Hall Effect MOSFET (HEMOS) is proposed. It is experimentally shown that the HEMOS enables a non-contacting, and non-disturbing current measurement...
ISCAS
2003
IEEE
13 years 10 months ago
2003
IEEE
Continuing trends in sensor, semiconductor and communication systems technology (smaller, faster, cheaper) make feasible very dense networks of fixed and mobile wireless devices ...
DAC
2009
ACM
14 years 6 months ago
2009
ACM
In this work, we present a new optical routing framework, O-Router for future low-power on-chip optical interconnect integration utilizing silicon compatible nano-photonic devices...