13 search results - page 2 / 3 » Test challenges for deep sub-micron technologies |
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
Spurred by technology leading to the availability of millions of gates per chip, system-level integration is evolving as a new paradigm, allowing entire systems to be built on a s...
ISQED
2006
IEEE
13 years 11 months ago
2006
IEEE
— With advanced VLSI manufacturing technology in deep submicron (DSM) regime, we can integrate entire electronic systems on a single chip (SoC). Due to the complexity in SoC desi...
AAAI
2007
13 years 7 months ago
2007
Knowledge-based recommender technologies support customers and sales representatives in the identification of appropriate products and services. These technologies are especially ...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
As technology evolves into the deep sub-micron era, signal integrity problems are growing into a major challenge. An important source of signal integrity problems is the crosstalk...
CCECE
2006
IEEE
13 years 11 months ago
2006
IEEE
Real Time embedded system designers are facing extreme challenges in underlying architectural design selection. It involves the selection of a programmable, concurrent, heterogene...