47 search results - page 3 / 10 » Testing and built-in self-test - A survey |
VTS
1995
IEEE
13 years 9 months ago
1995
IEEE
In this paper, we propose an entirely new Built-In Self Test scheme for high-level synthesis of data path architectures that makes use of the arithmetic blocks in the data path to...
ATS
2000
IEEE
13 years 10 months ago
2000
IEEE
We present a new pseudorandom testing algorithm for the Built-In Self-Test (BIST) of DRAM. In this algorithm, test patterns are complemented to generate state-transitions that are...
ISCAS
2002
IEEE
13 years 10 months ago
2002
IEEE
This paper presents a design of a low-voltage analog current detector supporting at-speed Built-In-Self-Test (BIST) methodology. In testing mode, the current detector performs a n...
VTS
2002
IEEE
13 years 10 months ago
2002
IEEE
Single-bit second-order delta-sigma modulators are commonly used in high-resolution ADCs. Testing this type of modulator requires a high-resolution test stimulus, which is diffic...
CATA
2009
13 years 6 months ago
2009
ABSTRACT: We present a Built-In Self-Test (BIST) approach for programmable embedded memories in Xilinx Virtex-4 Field Programmable Gate Arrays (FPGAs). The target resources are the...