115 search results - page 23 / 23 » The synthesis of cyclic combinational circuits |
ATS
1998
IEEE
13 years 9 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
JPDC
2000
13 years 5 months ago
2000
: SIMD arrays are likely to become increasingly important as coprocessors in domain specific systems as architects continue to leverage RAM technology in their design. The problem ...
ICCAD
2007
IEEE
14 years 2 months ago
2007
IEEE
— Starting at the 65nm node, stress engineering to improve performance of transistors has been a major industry focus. An intrinsic stress source – shallow trench isolation –...
ICCAD
2004
IEEE
14 years 2 months ago
2004
IEEE
— Cycle-accurate functional descriptions (CAFDs) are being widely adopted in integrated circuit (IC) design flows. Power estimation can potentially benefit from the inherent in...
ICCAD
2001
IEEE
14 years 2 months ago
2001
IEEE
The increasing popularity of SAT and BDD techniques in verification and synthesis encourages the search for additional speed-ups. Since typical SAT and BDD algorithms are exponent...