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    SERP
    2007
    182views Software Engineering» more  SERP 2007»
    From Functional Requirements through Test Evaluation Design to Automatic Test Data Patterns Retrieval - a Concept for Testing of
    13 years 7 months ago
    From Functional Requirements through Test Evaluation Design to Automatic Test Data Patterns Retrieval - a Concept for Testing of
    Download  web.fokus.fraunhofer.de
    - Functional testing of software dedicated for hybrid embedded systems should start at the early development phase and requires analysis of discrete and continuous signals, where t...
    Justyna Zander-Nowicka, Abel Marrero Pérez,...
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    DDECS
    2007
    IEEE
    133views Hardware» more  DDECS 2007»
    Prototyping Generators for On-line Test Vector Generation Based on PSL Properties
    13 years 8 months ago
    Prototyping Generators for On-line Test Vector Generation Based on PSL Properties
    Download  yann.oddos38.free.fr
    — From an assumed property, which constrains the inputs of a design under test, we produce a RTL synthesizable design that generates compliant sequences of values for all the sig...
    Yann Oddos, Katell Morin-Allory, Dominique Borrion...
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    DAC
    1999
    ACM
    129views Computer Architecture» more  DAC 1999»
    Proptest: A Property Based Test Pattern Generator for Sequential Circuits Using Test Compaction
    14 years 7 months ago
    Proptest: A Property Based Test Pattern Generator for Sequential Circuits Using Test Compaction
    Download  computing.ece.vt.edu
    Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz
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    DAC
    2005
    ACM
    139views Computer Architecture» more  DAC 2005»
    StressTest: an automatic approach to test generation via activity monitors
    14 years 7 months ago
    StressTest: an automatic approach to test generation via activity monitors
    Download  www.eecs.umich.edu
    The challenge of verifying a modern microprocessor design is an overwhelming one: Increasingly complex micro-architectures combined with heavy time-to-market pressure have forced ...
    Ilya Wagner, Valeria Bertacco, Todd M. Austin
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    ITC
    1997
    IEEE
    73views Hardware» more  ITC 1997»
    A Low-Overhead Design for Testability and Test Generation Technique for Core-Based Systems
    13 years 10 months ago
    A Low-Overhead Design for Testability and Test Generation Technique for Core-Based Systems
    Download  www.ra.informatik.uni-stuttgart.de
    In a fundamental paradigm shift in system design, entire systems are being built on a single chip, using multiple embedded cores. Though the newest system design methodology has s...
    Indradeep Ghosh, Niraj K. Jha, Sujit Dey
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