18 search results - page 2 / 4 » Universal Test Sets for Reversible Circuits |
ATS
2005
IEEE
13 years 7 months ago
2005
IEEE
Reversibility is of interest in achieving extremely low power dissipation; it is also an inherent design requirement of quantum computation. Logical fault models for conventional ...
VLSID
2003
IEEE
14 years 5 months ago
2003
IEEE
This paper introduces a Built-In Self Test (BIST) structure referred to as Universal BIST (UBIST). The Test Pattern Generator (TPG) of the proposed UBIST is designed to generate an...
ICCAD
1995
IEEE
13 years 8 months ago
1995
IEEE
In this paper, a new approach to analog test design based on the circuit design process, called Characteristic Observation Inference (COI), is presented. In many situations, it is...
EURODAC
1995
IEEE
13 years 8 months ago
1995
IEEE
: We present a new, dynamic algorithm for test sequence compaction and test cycle reduction for combinationaland sequential circuits. Several dynamic algorithms for compaction in c...
ASPDAC
2006
ACM
13 years 11 months ago
2006
ACM
Abstract— Substantial attention is being paid to the fault diagnosis problem in recent test literature. Yet, the compaction of test vectors for fault diagnosis is little explored...