Deterministic gate delay models have been widely used to find the transition probabilities at the nodes of a circuit for calculating the power dissipation. However, with progress...
—As process variations become a significant problem in deep sub-micron technology, a shift from deterministic static timing analysis to statistical static timing analysis for hig...
With aggressive scaling down of feature sizes in VLSI fabrication, process variation has become a critical issue in designs. We show that two necessary conditions for the "Max...
Existing static timing analyzers make several assumptions about circuits, implicitly trading off accuracy for speed. In this paper we examine the validity of these assumptions, no...
The ability to account for the growing impacts of multiple process variations in modern technologies is becoming an integral part of nanometer VLSI design. Under the context of ti...