6 search results - page 1 / 2 » Worst-case design and margin for embedded SRAM |
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
An important aspect of Design for Yield for embedded SRAM is identifying the expected worst case behavior in order to guarantee that sufficient design margin is present. Previousl...
VLSID
2009
IEEE
14 years 5 months ago
2009
IEEE
Abstract-- Single-ended static random access memory (SESRAM) is well known for their tremendous potential of low active power and leakage dissipations. In this paper, we present a ...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
Abstract— This paper presents a six-transistor (6T) singleended static random access memory (SE-SRAM) bitcell with an isolated read-port, suitable for low-Î and low-power embedd...
ISQED
2010
IEEE
13 years 3 months ago
2010
IEEE
Low power, minimum transistor count and fast access static random access memory (SRAM) is essential for embedded multimedia and communication applications realized using system on...
ECRTS
2010
IEEE
13 years 6 months ago
2010
IEEE
Embedded control systems with hard real-time constraints require that deadlines are met at all times or the system may malfunction with potentially catastrophic consequences. Sched...