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DAC
2011
ACM
12 years 5 months ago
Litmus tests for comparing memory consistency models: how long do they need to be?
Memory consistency litmus tests are small parallel programs that are designed to illustrate subtle differences between memory consistency models by exhibiting different outcomes...
Sela Mador-Haim, Rajeev Alur, Milo M. K. Martin
DAC
2011
ACM
12 years 5 months ago
Image quality aware metrics for performance specification of ADC array in 3D CMOS imagers
A three-dimensional (3D) CMOS imager constructed from stacking a pixel array of image sensors, an analog-to-digital converter (ADC) array, and an image signal processor (ISP) arra...
Hsiu-Ming Chang, Kwang-Ting (Tim) Cheng
DAC
2011
ACM
12 years 5 months ago
Synchronous sequential computation with molecular reactions
Just as electronic systems implement computation in terms of voltage (energy per unit charge), molecular systems compute in terms of chemical concentrations (molecules per unit vo...
Hua Jiang, Marc D. Riedel, Keshab K. Parhi
DAC
2011
ACM
12 years 5 months ago
AENEID: a generic lithography-friendly detailed router based on post-RET data learning and hotspot detection
In the era of deep sub-wavelength lithography for nanometer VLSI designs, manufacturability and yield issues are critical and need to be addressed during the key physical design i...
Duo Ding, Jhih-Rong Gao, Kun Yuan, David Z. Pan
DAC
2011
ACM
12 years 5 months ago
TSV stress-aware full-chip mechanical reliability analysis and optimization for 3D IC
In this work, we propose an efficient and accurate full-chip thermomechanical stress and reliability analysis tool and design optimization methodology to alleviate mechanical rel...
Moongon Jung, Joydeep Mitra, David Z. Pan, Sung Ky...