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VLSID
2004
IEEE
14 years 5 months ago
2004
IEEE
IDDQ test is a valuable test method for semiconductor manufacturers. However, its effectiveness is reduced for deep sub-micron technology chips due to rising background leakage. C...
FPL
2004
Springer
13 years 10 months ago
2004
Springer
In this paper we describe a parameterizable FPGA-based implementation of a sigma-delta converter used in a 96kHz audio DAC. From specifications of the converter’s input bitwidth...
CAISE
2004
Springer
13 years 10 months ago
2004
Springer
Fueled by the omnipresence of event logs in transactional information systems (cf. WFM, ERP, CRM, SCM, and B2B systems), process mining has become a vivid research area. Until rece...
CIKM
2004
Springer
13 years 10 months ago
2004
Springer
Recently, a large amount of work has been done in XML data mining. However, we observed that most of the existing works focus on the snapshot XML data, while XML data is dynamic i...
DELTA
2004
IEEE
13 years 8 months ago
2004
IEEE
Complex arithmetic computations, especially if derived from bit-level software descriptions, can be very inefficient if implemented directly in hardware (e.g., by translation of t...