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ICCAD
2010
IEEE
13 years 2 months ago
2010
IEEE
Reducing circuit's peak current plays an important role in circuit reliability in deep sub-micron era. For sequential circuits, it is observed that the peak current has a str...
ICCAD
2010
IEEE
13 years 2 months ago
2010
IEEE
Abstract-- Many of us in the field of ultra-low-Vdd processors experience difficulty in assessing the sub/near threshold circuit techniques proposed by earlier papers. This paper i...
ICCAD
2010
IEEE
13 years 2 months ago
2010
IEEE
Clock skew minimization has been an important design constraint. However, due to the complexity of Process, Voltage, and Temperature (PVT) variations, the minimization of clock sk...
ICCAD
1997
IEEE
13 years 8 months ago
1997
IEEE
Interconnect has become the dominating factor in determining circuit performance and reliability in deep submicron designs. In this embedded tutorial, we first discuss the trends...
ISPD
2010
ACM
13 years 11 months ago
2010
ACM
Existing 3D placement techniques are mainly used for standardcell circuits, while mixed-size placement is needed to support highlevel functional units and intellectual property (I...