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ITC
2003
IEEE
126views Hardware» more  ITC 2003»
13 years 10 months ago
Deformations of IC Structure in Test and Yield Learning
This paper argues that the existing approaches to modeling and characterization of IC malfunctions are inadequate for test and yield learning of Deep Sub-Micron (DSM) products. Tr...
Wojciech Maly, Anne E. Gattiker, Thomas Zanon, Tho...
ISQED
2003
IEEE
85views Hardware» more  ISQED 2003»
13 years 10 months ago
Interoperability Beyond Design: Sharing Knowledge between Design and Manufacturing
The nature of IC design has is necessarily evolving to a more data-centric design flow in which EDA tools share a common information in a design database without the negative cost...
D. R. Cottrell, T. J. Grebinski
ICCAD
2003
IEEE
118views Hardware» more  ICCAD 2003»
14 years 2 months ago
Efficient Thermal Placement of Standard Cells in 3D ICs using a Force Directed Approach
As the technology node progresses, thermal problems are becoming more prominent especially in the developing technology of three-dimensional (3D) integrated circuits. The thermal ...
Brent Goplen, Sachin S. Sapatnekar
IC
2003
13 years 6 months ago
Efficiency of Soap Versus JMS
Parallel application programmers and software engineers have a variety of paradigms at their disposal. Some of the tools include traditional environments such as Parallel Virtual ...
Roger Eggen, Suresh Sunku
IC
2003
13 years 6 months ago
Denying Denial-of-Service Attacks: A Router Based Solution
Distributed Denial-of-Service (DDoS) attacks prevent users from accessing services on the target network by flooding the target network with a large volume of traffic. In this pap...
Zhang Shu, Partha Dasgupta