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GLVLSI
2009
IEEE
13 years 12 months ago
2009
IEEE
This paper introduces pass-transistor logic design with dualthreshold voltages. A set of single-rail, fully restored, passtransistor gates are presented. Logic transistors are imp...
ASPDAC
2009
ACM
13 years 11 months ago
2009
ACM
Low power circuits have become a necessary part in modern designs. Retention flip-flop is one of the most important components in low power designs. Conventional test methodologie...
GLVLSI
2009
IEEE
13 years 9 months ago
2009
IEEE
Current lithography techniques use a light wavelength of 193nm to print sub-65nm features. This introduces process variations which cause mismatches between desired and actual waf...
ICCAD
2009
IEEE
13 years 3 months ago
2009
IEEE
The lack of good "correlation" between pre-silicon simulated delays and measured delays on silicon (silicon data) has spurred efforts on so-called silicon debug. The ide...
DAC
2009
ACM
14 years 1 days ago
2009
ACM
Manufacturing process variability impacts the performance of synchronous logic circuits by means of its effect on both clock network and functional block delays. Typically, varia...