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ISCA
2009
IEEE
14 years 11 days ago
2009
IEEE
While Moore’s Law predicts the ability of semi-conductor industry to engineer smaller and more efficient transistors and circuits, there are serious issues not contemplated in t...
ATS
2009
IEEE
14 years 17 days ago
2009
IEEE
Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets,...
DATE
2009
IEEE
14 years 15 days ago
2009
IEEE
Abstract—Multiple-voltage is an effective dynamic power reduction design technique. Recent research has shown that testing for resistive bridging faults in such designs requires ...
DATE
2009
IEEE
14 years 15 days ago
2009
IEEE
—Negative Bias Temperature Instability (NBTI) is a significant reliability concern for nanoscale CMOS circuits. Its effects on circuit timing can be especially pronounced for ci...
GLVLSI
2009
IEEE
14 years 15 days ago
2009
IEEE
In this work we propose an online reliability tracking framework that utilizes a hybrid network of on-chip temperature and delay sensors together with a circuit reliability macrom...