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ISQED
2008
IEEE
14 years 16 days ago
2008
IEEE
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
ISQED
2008
IEEE
14 years 16 days ago
2008
IEEE
Off-chip communication consumes a significant part of main memory system power. Existing solutions imply the use of specialized memories or assume error free environments. This i...
ISQED
2008
IEEE
14 years 16 days ago
2008
IEEE
—Power and energy consumption has emerged as the premier and most constraining aspect in modern computational systems. Dynamic Voltage Scheduling (DVS) has been provably one of t...
ISQED
2008
IEEE
14 years 16 days ago
2008
IEEE
The advance in semiconductor technologies presents the serious problem of parameter variations. They affect threshold voltage of transistors and thus circuit delay also has variat...
ISQED
2008
IEEE
14 years 16 days ago
2008
IEEE
SRAM leakage power dominates the total power of low duty-cycle applications, e.g., sensor nodes. Accordingly, leakage power reduction during data-retention in SRAM standby is ofte...