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ISVLSI
2007
IEEE
161views VLSI» more  ISVLSI 2007»
13 years 11 months ago
CMP-aware Maze Routing Algorithm for Yield Enhancement
— Chemical-Mechanical Polishing (CMP) is one of the key steps during nanometer VLSI manufacturing process where minimum variation of layout pattern densities is desired. This pap...
Hailong Yao, Yici Cai, Xianlong Hong
ISVLSI
2007
IEEE
205views VLSI» more  ISVLSI 2007»
13 years 11 months ago
An Automated Passive Analog Circuit Synthesis Framework using Genetic Algorithms
In this work, we present a genetic algorithm based automated circuit synthesis framework for passive analog circuits. A procedure is developed for the simultaneous generation of b...
Angan Das, Ranga Vemuri
ISVLSI
2007
IEEE
121views VLSI» more  ISVLSI 2007»
13 years 11 months ago
Performance of Graceful Degradation for Cache Faults
In sub-90nm technologies, more frequent hard faults pose a serious burden on processor design and yield control. In addition to manufacturing-time chip repair schemes, microarchit...
Hyunjin Lee, Sangyeun Cho, Bruce R. Childers
ISVLSI
2007
IEEE
230views VLSI» more  ISVLSI 2007»
13 years 11 months ago
A Methodology and Toolset to Enable SystemC and VHDL Co-simulation
The new design challenges imposed by the increasing difficulties of today’s electronic systems obligated designers to develop new methodologies. System-level design and Platfor...
Richard Maciel, Bruno Albertini, Sandro Rigo, Guid...
ISVLSI
2007
IEEE
181views VLSI» more  ISVLSI 2007»
13 years 11 months ago
Code-coverage Based Test Vector Generation for SystemC Designs
Abstract— Time-to-Market plays a central role on System-ona-Chip (SoC) competitiveness and the quality of the final product is a matter of concern as well. As SoCs complexity in...
Alair Dias Jr., Diógenes Cecilio da Silva J...