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ITC
1999
IEEE
13 years 10 months ago
1999
IEEE
ITC
1999
IEEE
13 years 10 months ago
1999
IEEE
Resistive bridging faults in combinational CMOS circuits are studied in this work. Circuit-level models are ed to voltage behavior for use in voltage-level fault simulation and te...
ITC
1999
IEEE
13 years 10 months ago
1999
IEEE
Static Component Interconnection Test Technology (SCITT) is a new XNOR circuit based technology that is used for board-level interconnection test. SCITT provides an easy test meth...
ITC
1999
IEEE
13 years 10 months ago
1999
IEEE
The embedded core testing methodology at Advanced Micro Devices Inc. involves adopting a disciplined system for developing new products with a focus on time to market and engineer...
ITC
1999
IEEE
13 years 10 months ago
1999
IEEE
SEMATECH has sponsored a "Test Method Evaluation" study to understand the trade-offs among the most common test methodologies used in the industry[1,2]. This paper prese...