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    ITC
    2003
    IEEE
    124views Hardware» more  ITC 2003»
    Low Contact-Force Fritting Probe Card Using Buckling Microcantilevers
    13 years 10 months ago
    Low Contact-Force Fritting Probe Card Using Buckling Microcantilevers
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    Kenichi Kataoka, Toshihiro Itoh, Tadatomo Suga
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    ITC
    2003
    IEEE
    93views Hardware» more  ITC 2003»
    On Reducing Test Data Volume and Test Application Time for Multiple Scan Chain Designs
    13 years 10 months ago
    On Reducing Test Data Volume and Test Application Time for Multiple Scan Chain Designs
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    Huaxing Tang, Sudhakar M. Reddy, Irith Pomeranz
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    ITC
    2003
    IEEE
    135views Hardware» more  ITC 2003»
    VDD Ramp Testing for RF Circuits
    13 years 10 months ago
    VDD Ramp Testing for RF Circuits
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    José Pineda de Gyvez, Guido Gronthoud, Rash...
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    ITC
    2003
    IEEE
    116views Hardware» more  ITC 2003»
    Circular BIST testing the digital logic within a high speed Serdes
    13 years 10 months ago
    Circular BIST testing the digital logic within a high speed Serdes
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    High Speed Serializer Deserializers (serdes) are traditionally tested using functional BIST. This paper presents an improved BIST for testing the digital part of a serdes using ci...
    Graham Hetherington, Richard Simpson
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    ITC
    2003
    IEEE
    107views Hardware» more  ITC 2003»
    The PXI Modular Instrumentation Architecture
    13 years 10 months ago
    The PXI Modular Instrumentation Architecture
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    This paper is a technology review of PXI. It describes the basic PXI architecture and looks in more detail at the features of the slot 2 timing and triggering module.
    Eric Starkloff, Tim Fountain, Garth Black
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