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    VTS
    1996
    IEEE
    105views Hardware» more  VTS 1996»
    Improvement of SRAM-based failure analysis using calibrated Iddq testing
    13 years 9 months ago
    Improvement of SRAM-based failure analysis using calibrated Iddq testing
    Download  research.cs.tamu.edu
    Hari Balachandran, D. M. H. Walker
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    VTS
    1996
    IEEE
    80views Hardware» more  VTS 1996»
    Improving the accuracy of diagnostics provided by fault dictionaries
    13 years 9 months ago
    Improving the accuracy of diagnostics provided by fault dictionaries
    Download  www.cs.jhu.edu
    John W. Sheppard, William R. Simpson
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    VTS
    1996
    IEEE
    75views Hardware» more  VTS 1996»
    A new test pattern generation method for delay fault testing
    13 years 9 months ago
    A new test pattern generation method for delay fault testing
    Download  www.lirmm.fr
    S. Cremoux, Christophe Fagot, Patrick Girard, Chri...
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    VTS
    1996
    IEEE
    74views Hardware» more  VTS 1996»
    An unexpected factor in testing for CMOS opens: the die surface
    13 years 9 months ago
    An unexpected factor in testing for CMOS opens: the die surface
    Download  www.soe.ucsc.edu
    In this paper, we for the rst time present experimental evidence that the die surface can act as an RC interconnect, becoming an important factor in determining the voltage of a o...
    Haluk Konuk, F. Joel Ferguson
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    VTS
    1996
    IEEE
    114views Hardware» more  VTS 1996»
    Quantitative analysis of very-low-voltage testing
    13 years 9 months ago
    Quantitative analysis of very-low-voltage testing
    Download  crc.stanford.edu
    Some weak static CMOS chips can be detected by testing them with a very low supply voltage -- between 2 and 2.5 times the threshold voltage Vt of the transistors. A weak chip is o...
    Jonathan T.-Y. Chang, Edward J. McCluskey
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