21 search results - page 2 / 5 » vts 2002 |
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single Inp...
ICPR
2002
IEEE
14 years 5 months ago
2002
IEEE
We study the combination of face verification algorithms in order to improve the verification performance. Although the different face experts that we consider provide their outpu...
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
Fault diagnosis is to predict the potential fault sites in a logic IC. In this paper, we particularly address the problem of diagnosing faults that exhibit the so-called Byzantine...
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
Parallel test application helps reduce the otherwise considerable test times in SOCs; yet its applicability is limited by average and peak power considerations. The typical test v...
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
The ever increasing trend to reduce DPM levels of memories requires tests with very high fault coverages. The very important class of dynamic fault, therefore cannot be ignored an...