VTS
2000
IEEE
13 years 9 months ago
2000
IEEE
Delay defects can escape detection during the normal production test flow, particularly if they do not affect any of the long paths included in the test flow. Some defect types ca...
ASPDAC
2006
ACM
13 years 10 months ago
2006
ACM
This paper presents a case-study of delay defect screening applied to Fujitsu 2.16GHz SPARC64 microprocessor. A nonrobust delay test is used while each test vector is compacted to...
VTS
2008
IEEE
13 years 11 months ago
2008
IEEE
With increasing IC process variation and increased operating speed, it is more likely that even subtle defects will lead to the malfunctioning of a circuit. Various fault models, ...