Sciweavers

Share
VTS
2000
IEEE
108views Hardware» more  VTS 2000»
8 years 11 months ago
Cold Delay Defect Screening
Delay defects can escape detection during the normal production test flow, particularly if they do not affect any of the long paths included in the test flow. Some defect types ca...
Chao-Wen Tseng, Edward J. McCluskey, Xiaoping Shao...
ASPDAC
2006
ACM
155views Hardware» more  ASPDAC 2006»
9 years 1 months ago
Delay defect screening for a 2.16GHz SPARC64 microprocessor
This paper presents a case-study of delay defect screening applied to Fujitsu 2.16GHz SPARC64 microprocessor. A nonrobust delay test is used while each test vector is compacted to...
Noriyuki Ito, Akira Kanuma, Daisuke Maruyama, Hito...
VTS
2008
IEEE
119views Hardware» more  VTS 2008»
9 years 1 months ago
Error Sequence Analysis
With increasing IC process variation and increased operating speed, it is more likely that even subtle defects will lead to the malfunctioning of a circuit. Various fault models, ...
Jaekwang Lee, Intaik Park, Edward J. McCluskey
books